Key Takeaways
Researchers have solved the puzzle behind single-event burnout (SEB).
The researchers developed an analytical model that successfully explains SEB across multiple materials.
It could help develop new generation of hardware built to survive deep space, nuclear reactors, and fusion experiments.
Scientists identified the exact chain reaction that causes high-power electronics to fail when hit by radiation.
In extreme environments like outer space or nuclear reactors, a single particle of radiation can hit an electronic chip and trigger a sudden, massive energy surge that permanently destroys it.
Researchers at North Carolina State University finally mapped the step-by-step physics of how that destruction happens inside the material, rather than guessing or relying on trial and error.
Particularly, the team solved the underlying puzzle behind single-event burnout (SEB). It is a phenomenon where radiation exposure causes catastrophic, inoperable failure in electronic devices under high voltage.
The study findings could pave the way for a new generation of hardware built to survive deep space, nuclear reactors, and fusion experiments.
Superior field tolerance
The discovery began when the team set out to test the limits ofaluminum nitride(AIN), an ultrawide bandgap semiconductor capable of handling massive power loads. To make fair comparisons with common materials likesilicon, the scientists shifted their focus from raw voltage to the electric field a material can withstand before failing.
Aluminum nitride outperformed standard semiconductors by nearly an order of magnitude, proving it can withstand vastly more extreme electrical stress.
“Before, we knew SEB happened, and we could test a device’s capacity to withstand SEB,” said Cristyan Quiñones, corresponding author of the study and a recent NC State Ph.D. graduate. “But now we know why.”
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Combiningexperimental datawith computational simulations, the team built an analytical model that maps out the microscopic chaos inside a radiated chip.
When a heavy ion slices through a semiconductor under high voltage, it leaves a trail of positive and negative charge carriers in its wake. The applied voltage pulls these opposing charges apart, creating a highly localized spike in the electric field.
Once that spike crosses a critical threshold, it unleashes a violent avalanche of electrons that dumps massive energy into a tiny area, physically destroying the device.
New predictive model
The researchers checked their new model against existing burnout data from multiple semiconductormaterials, and the math held up across the board.
“Understanding the actual physics behind SEB is important,”saidco-author Ramón Collazo, a professor of materials science and engineering at NC State. “We could not do that before, because we did not know what was actually happening in detail. This new understanding means we can develop design rules to harden devices against radiation and minimize the damage caused by SEB.”
Aluminum nitride excels in extreme industrial and aerospace environments because of its durability. Its ability to resist radiation, intense heat, and strong electrical fields makes it well suited for satellite electronics, deep-space probes, radar systems, andnuclear reactorsensors.
With this predictive information, engineers no longer have to rely on trial and error to shield sensitive hardware. The findings offer a direct path toward designing resilient electronics for everything from advanced biomedical technologies to the harsh frontiers of outer space.
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Explore Now!By
Mrigakshi DixitMrigakshi is a science journalist who enjoys writing about space exploration, biology, and technological innovations. Her work has been featured in well-known publications including Nature India, Supercluster, The Weather Channel and Astronomy magazine. If you have pitches in mind, please do not hesitate to email her.
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Key Takeaways
Researchers have solved the puzzle behind single-event burnout (SEB).
The researchers developed an analytical model that successfully explains SEB across multiple materials.
It could help develop new generation of hardware built to survive deep space, nuclear reactors, and fusion experiments.
Scientists identified the exact chain reaction that causes high-power electronics to fail when hit by radiation.
In extreme environments like outer space or nuclear reactors, a single particle of radiation can hit an electronic chip and trigger a sudden, massive energy surge that permanently destroys it.
Researchers at North Carolina State University finally mapped the step-by-step physics of how that destruction happens inside the material, rather than guessing or relying on trial and error.
Particularly, the team solved the underlying puzzle behind single-event burnout (SEB). It is a phenomenon where radiation exposure causes catastrophic, inoperable failure in electronic devices under high voltage.
The study findings could pave the way for a new generation of hardware built to survive deep space, nuclear reactors, and fusion experiments.
Superior field tolerance
The discovery began when the team set out to test the limits ofaluminum nitride(AIN), an ultrawide bandgap semiconductor capable of handling massive power loads. To make fair comparisons with common materials likesilicon, the scientists shifted their focus from raw voltage to the electric field a material can withstand before failing.
Aluminum nitride outperformed standard semiconductors by nearly an order of magnitude, proving it can withstand vastly more extreme electrical stress.
“Before, we knew SEB happened, and we could test a device’s capacity to withstand SEB,” said Cristyan Quiñones, corresponding author of the study and a recent NC State Ph.D. graduate. “But now we know why.”
More from Space
See AllSpaceTwo-way spacecraft refueling port costs just $1, set for first-ever orbital xenon testInnovation3D-printed polymer hinges cut satellite solar panel deployment weight by 93%Space220,000 lbs of thrust: Methane-fueled reusable rocket engine clears ground testsSpace26.7 billion years old, no dark matter: Can this universe beat the cosmic clock?SpaceA piece of Mars older than 4 billion years reveals its ancient watery historyAccording to the study, aluminum nitride Schottky barrier and p-n diodes can withstand electric fields nearly ten times stronger than those in common semiconductors before suffering single-event burnout. Like other semiconductor materials, their burnout thresholds drop as ion linear energy transfer increases.
Combiningexperimental datawith computational simulations, the team built an analytical model that maps out the microscopic chaos inside a radiated chip.
When a heavy ion slices through a semiconductor under high voltage, it leaves a trail of positive and negative charge carriers in its wake. The applied voltage pulls these opposing charges apart, creating a highly localized spike in the electric field.
Once that spike crosses a critical threshold, it unleashes a violent avalanche of electrons that dumps massive energy into a tiny area, physically destroying the device.
New predictive model
The researchers checked their new model against existing burnout data from multiple semiconductormaterials, and the math held up across the board.
“Understanding the actual physics behind SEB is important,”saidco-author Ramón Collazo, a professor of materials science and engineering at NC State. “We could not do that before, because we did not know what was actually happening in detail. This new understanding means we can develop design rules to harden devices against radiation and minimize the damage caused by SEB.”
Aluminum nitride excels in extreme industrial and aerospace environments because of its durability. Its ability to resist radiation, intense heat, and strong electrical fields makes it well suited for satellite electronics, deep-space probes, radar systems, andnuclear reactorsensors.
With this predictive information, engineers no longer have to rely on trial and error to shield sensitive hardware. The findings offer a direct path toward designing resilient electronics for everything from advanced biomedical technologies to the harsh frontiers of outer space.
Get the latest in engineering, tech, space & science - delivered daily to your inbox.
By subscribing, you agree to our
Terms of Useand
PoliciesYou may unsubscribe at any time.
0
COMMENT
Subscribe to
Today!
Access to exclusive content, expert insights and a deeper dive into engineering and tech. No ads, no limits.
Explore Now!By
Mrigakshi DixitMrigakshi is a science journalist who enjoys writing about space exploration, biology, and technological innovations. Her work has been featured in well-known publications including Nature India, Supercluster, The Weather Channel and Astronomy magazine. If you have pitches in mind, please do not hesitate to email her.
- 1Mars robot swarms to use star sensors, radio beacons for autonomous navigation
- 2930 mph unmanned supersonic aircraft gets advanced systems for military missions
- 3Microsoft 365 outage affects 130,000 users as engineers race to restore services
- 4Google launches Gemini 4 Hydrogen, scores 57% on coding benchmark, triples Flash
- 5New hydrogen tech could put fast-starting turbines at center of grid decarbonization
